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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
Pulse porosity (Holiday) detector. Detects pinholes in coatings and wrapping above 150µm on metal substrates such as pipes and tanks. Can..
Defelsco PosiTector 200 Advanced ultrasonic coating thickness gauge with type B & C Probes. Measures coating thicknes over wood, concre..
The Olympus 38DL Plus Ultrasonic Thickness Gauge performs non-destructive measurements. This unit is supplied with transducers that can meas..
DC Porosity (Holiday) detector. Detects pinholes in coatings above 150um on metal substrates such as pipes and tanks. 0-30kV, 3.5 digit L..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis
